NanoPhotonics AG Mainz (Germany)

Business overview

Whatever you are looking for – NP provides thin film measure-ment & defect inspection for R&D, automated in-line quality monitoring, and for integrated metrology applications. We have smarter metrology solutions for a wide range of applications ranging from 300 mm silicon technology, compound semiconductors, and MEMS to optoelectronics. Our modular product architecture and strong engineering capabilities allow us to react quickly to customers’ needs and to provide cost efficient solutions for both stand-alone and integrated metrology applications. Moreover, the measurement and inspection systems of NP’s REFLEX and ELLIPSON? lines can be combined within compact EFEM platforms to meet the customer’s specific needs for flexible and fast quality control. This MetriCluster concept allows many different configurations for both 8” and 12” wafers.

Products & Services

Provides thin film measurement equipment, application and knowledge support, ultra-compact and rugged thin film quality monitoring instruments designed for integrated metrology.

Contact Details

NanoPhotonics AG

Galileo-Galilei-Str. 28,
Mainz, D-55129 () - (Germany)